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  <front>
    <journal-meta>
      <journal-id journal-id-type="publisher-id">JDS</journal-id>
      <journal-title-group>
        <journal-title>Journal of Data Science</journal-title>
      </journal-title-group>
      <issn pub-type="epub">1680-743X</issn>
      <issn pub-type="ppub">1680-743X</issn>
      <publisher>
        <publisher-name>SOSRUC</publisher-name>
      </publisher>
    </journal-meta>
    <article-meta>
      <article-id pub-id-type="publisher-id">03.NO.7-321</article-id>
      <article-id pub-id-type="doi">10.6339/JDS.201907_17(3).0007</article-id>
      <article-categories>
        <subj-group subj-group-type="heading">
          <subject>Research Article</subject>
        </subj-group>
      </article-categories>
      <title-group>
        <article-title>Modeling on Generalized Extended Inverse Weibull Software Reliability Growth Model</article-title>
      </title-group>
      <contrib-group>
        <contrib contrib-type="author">
          <name>
            <surname>Hanagal</surname>
            <given-names>David D.</given-names>
          </name>
          <xref ref-type="aff" rid="j_JDS_aff_000"/>
        </contrib>
        <aff id="j_JDS_aff_000">Department of Statistics, Savitribai Phule Pune University, Pune-411007, India</aff>
        <contrib contrib-type="author">
          <name>
            <surname>Bhalerao</surname>
            <given-names>Nileema N.</given-names>
          </name>
          <xref ref-type="aff" rid="j_JDS_aff_001"/>
        </contrib>
        <aff id="j_JDS_aff_001">Department of Statistics, Savitribai Phule Pune University, Pune-411007, India.</aff>
      </contrib-group>
      <volume>17</volume>
      <issue>3</issue>
      <fpage>575</fpage>
      <lpage>592</lpage>
      <permissions>
        <ali:free_to_read xmlns:ali="http://www.niso.org/schemas/ali/1.0/"/>
      </permissions>
      <abstract>
        <p>In this paper we introduce the generalized extended inverse Weibull finite failure software reliability growth model which includes both increasing/decreasing nature of the hazard function. The increasing/decreasing behavior of failure occurrence rate fault is taken into account by the hazard of the generalized extended inverse Weibull distribution. We proposed a finite failure non-homogeneous Poisson process (NHPP) software reliability growth model and obtain unknown model parameters using the maximum likelihood method for interval domain data. Illustrations have been given to estimate the parameters using standard data sets taken from actual software projects. A goodness of fit test is performed to check statistically whether the fitted model provides a good fit with the observed data. We discuss the goodness of fit test based on the Kolmogorov-Smirnov (K-S) test statistic. The proposed model is compared with some of the standard existing models through error sum of squares, mean sum of squares, predictive ratio risk and Akaikes information criteria using three different data sets. We show that the observed data fits the proposed software reliability growth model. We also show that the proposed model performs satisfactory better than the existing finite failure category models</p>
      </abstract>
      <kwd-group>
        <label>Keywords</label>
        <kwd>Akaikes information criterion</kwd>
        <kwd>Generalized extended inverse Weibull distribution</kwd>
        <kwd>Hazard function</kwd>
        <kwd>Predictive ratio risk</kwd>
      </kwd-group>
    </article-meta>
  </front>
</article>
